Scios 3 FIB-SEM

The recently launched Thermo Scientific Scios 3 FIB-SEM is a high-resolution, analytical FIB-SEM designed for advanced sample preparation and 3D characterization of a wide range of materials, including magnetic and non-conductive samples. With automation, user-friendly software, and features that enhance throughput and reliability, it delivers high productivity for research and analysis across industry and academia.