Nexsa G2 Surface Analysis System

The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. By integrating XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, it allows you to conduct true correlative analysis. Thermo Fisher’s CISA (Correlative Imaging and Surface Analysis) workflow combines SEM/EDS and XPS to provide both structural and surface chemical data from the same sample region. Compatible with systems like the Nexsa XPS, it enables precise, correlative analysis for materials such as catalysts, polymers, and coatings.